O. Kanert: search on Z-Library

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1

[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Failure mechanisms of low-voltage trench power MOSFETs under repetitive avalanche conditions

Bach, Karl Heinz, Asam, Michael, Kanert, Werner

Year:

2012

Language:

english

File:

PDF, 1.65 MB

english, 2012

2

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Observations of copper (Cu) transport in through-silicon vias (TSV) structure by electrical characterization for its reliability evaluation

Chan, Jiawei Marvin, Tan, Chuan Seng, Lee, Kheng Chooi, Cheng, Xu, Kanert, Werner

Year:

2017

Language:

english

File:

PDF, 1.54 MB

english, 2017

3

[IEEE Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Linz, Austria (2011.04.18-2011.04.20)] 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Degradation of moulding compounds during highly accelerated stress tests. A simple approach to study adhesion by performing button shear tests

Pufall, R., Goroll, M., Mahler, J., Kanert, W., Bouazza, M., Wittler, O., Dudek, R.

Year:

2011

Language:

english

File:

PDF, 1.91 MB

english, 2011

4

[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Reliability Evaluation of Copper (Cu) Through-Silicon Vias (TSV) Barrier and Dielectric Liner by Electrical Characterization and Physical Failure Analysis (PFA)

Chan, Jiawei Marvin, Cheng, Xu, Lee, Kheng Chooi, Kanert, Werner, Tan, Chuan Seng

Year:

2017

Language:

english

File:

PDF, 3.70 MB

english, 2017

5

The vertical concept of power MOSFETs

C Tolksdorf, C Fink, J Schulze, S Sedlmaier, W Hansch, W Werner, W Kanert, I Eisele

Journal:

Materials Science and Engineering: B

Year:

2002

Language:

english

File:

PDF, 341 KB

english, 2002

6

Correlation between the activation enthalpy and Kohlrausch exponent for ionic conductivity in alkali aluminogermanate glasses

Ngai, K. L., Mundy, J. N., Jain, H., Kanert, O., Balzer-Jollenbeck, G.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 556 KB

english, 1989

7

Robustness Validation – A physics of failure based approach to qualification

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

8

Investigation of self-diffusion in nanocrystalline copper by NMR

W. Dickenscheid, R. Birringer, H. Gleiter, O. Kanert, B. Michel, B. Günther

Journal:

Solid State Communications

Year:

1991

Language:

english

File:

PDF, 339 KB

english, 1991

9

ESD protection structure qualification – a new approach for release for automotive applications

M. Goroll, W. Kanert, R. Pufall

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 355 KB

english, 2006

10

Investigation of dislocation dynamics by nuclear magnetic resonance

Wolf, D., Kanert, O.

Journal:

Physical Review B

Year:

1977

Language:

english

File:

PDF, 1.22 MB

english, 1977

11

In situ nuclear magnetic resonance investigation of deformation-generated vacancies in aluminum

Detemple, K., Kanert, O., De Hosson, J. Th. M., Murty, K. L.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 487 KB

english, 1995

12

Self-diffusion mechanism in solid sodium by NMR

Brünger, G., Kanert, O., Wolf, D.

Journal:

Physical Review B

Year:

1980

Language:

english

File:

PDF, 543 KB

english, 1980

13

Degradation of moulding compounds during highly accelerated stress tests – A simple approach to study adhesion by performing button shear tests

R. Pufall, M. Goroll, J. Mahler, W. Kanert, M. Bouazza, O. Wittler, R. Dudek

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.69 MB

english, 2012

14

Low-frequency excitations in sodium β-alumina: An NMR study

Sieranski, H., Kanert, O., Backens, M., Strom, U., Ngai, K. L.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 225 KB

english, 1993

15

Correspondence between nuclear-spin relaxation and electrical conductivity in glasses at low temperatures

Kanert, O., Küchler, R., Dieckhöfer, J., Lu, X., Jain, H.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 229 KB

english, 1994

16

Investigation of dislocation movement by nuclear-spin-relaxation experiments in the rotating frame

Hut, G., Sleeswyk, A. W., Hackelöer, H. J., Selbach, H., Kanert, O.

Journal:

Physical Review B

Year:

1976

Language:

english

File:

PDF, 973 KB

english, 1976

17

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors

S. Aresu, W. Kanert, R. Pufall, M. Goroll

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 201 KB

english, 2007

18

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications

Pufall, R., Kanert, W., Aresu, S., Goroll, M.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 824 KB

english, 2008

19

O

Hagemeyer, A., Kanert, O., Balzer-Jöllenbeck, G., Jain, H.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 487 KB

english, 1989

20

Hydrodynamic modeling of avalanche breakdown in a gate overvoltage protection structure

Martin Knaipp, Werner Kanert, Siegfried Selberherr

Journal:

Solid-State Electronics

Year:

2000

Language:

english

File:

PDF, 340 KB

english, 2000

21

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Vertical power-MOSFETs with local channel doping

Fink, C., Schulze, J., Eisele, I., Hansch, W., Werner, W., Kanert, W.

Year:

2000

Language:

english

File:

PDF, 380 KB

english, 2000

22

in tellurium due to ultraslow atomic motion

Günther, B., Kanert, O., Mehring, M., Wolf, D.

Journal:

Physical Review B

Year:

1981

Language:

english

File:

PDF, 158 KB

english, 1981

23

-doped NaOD-water system in the amorphous and polycrystalline phases

Floridi, G., Brandis, D., Kanert, O., Dinse, K. P., Cannistraro, S.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 294 KB

english, 1993

24

Significant differences between nuclear-spin relaxation and conductivity relaxation in low-conductivity glasses

Kanert, O., Küchler, R., Ngai, K. L., Jain, H.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 430 KB

english, 1994

25

The separation of rhodium and iridium by anion-exchange

G.A. Kanert, A. Chow

Journal:

Analytica Chimica Acta

Year:

1975

Language:

english

File:

PDF, 459 KB

english, 1975

26

Reliability aspects of semiconductor devices in high temperature applications

W. Kanert, H. Dettmer, B. Plikat, N. Seliger

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.30 MB

2003

27

NMR investigation of the diffusion and conduction properties of the semiconductor tellurium. I. Electronic properties

Selbach, H., Kanert, O., Wolf, D.

Journal:

Physical Review B

Year:

1979

Language:

english

File:

PDF, 594 KB

english, 1979

28

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices

Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 450 KB

english, 2007

29

Active cycling reliability of power devices: Expectations and limitations

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.39 MB

english, 2012

30

Nuclear-magnetic-resonance study of crystalline tellurium and selenium

Günther, B., Kanert, O.

Journal:

Physical Review B

Year:

1985

Language:

english

File:

PDF, 784 KB

english, 1985

31

NMR Study of Aluminium Diffusion in Solid Noble Metal: Al Alloys

Günther, B., Kolem, H., Kanert, Otmar

Journal:

Materials Science Forum

Year:

1987

File:

PDF, 315 KB

1987

32

O (KCP) below the metal-insulator transition

Mali, M., Kanert, O., Mehring, M., Brinkmann, D.

Journal:

Physical Review B

Year:

1979

Language:

english

File:

PDF, 275 KB

english, 1979

33

New interpretation of activation enthalpies for electrical conductivity and nuclear spin relaxation in glassy ionic conductors

Balzer-Jöllenbeck, G., Kanert, O., Jain, H., Ngai, K. L.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 210 KB

english, 1989

34

Calciumoxyd- und Magnesiumoxyd- Gehalt im Sinterdolomit kleiner Körnungen

Dr. F. Glaser, Dr. E. Kanert, Dipl.-Chem. Th. Hake

Journal:

Chemie Ingenieur Technik

Year:

1962

Language:

german

File:

PDF, 325 KB

german, 1962

35

X-ray and nuclear magnetic resonance investigations on deformed aluminium single crystals

O. Kanert, K. Preusser

Journal:

physica status solidi (a)

Year:

1973

Language:

english

File:

PDF, 394 KB

english, 1973

36

Ist die echte Geschoßwanderung selten?

Journal:

Archives of Orthopaedic and Trauma Surgery

Year:

1935

Language:

german

File:

PDF, 190 KB

german, 1935

37

Über die Tüpfel vonCeramium

Maria Hütter-Kanert

Journal:

Year:

1951

Language:

german

File:

PDF, 410 KB

german, 1951

38

Nuclear spin relaxation and atomic motion in inorganic glasses

O. Kanert, J. Steinert, H. Jain, K.L. Ngai

Journal:

Journal of Non-Crystalline Solids

Year:

1991

Language:

english

File:

PDF, 746 KB

english, 1991

39

Nuclear spin relaxation in electrolyte glasses

O Kanert, A Hackmann, R Küchler, K.L Ngai

Journal:

Journal of Non-Crystalline Solids

Year:

1994

Language:

english

File:

PDF, 341 KB

english, 1994

40

`Jellyfish' fluctuations of atoms in solids

H. Jain, S. Krishnaswami, O. Kanert

Journal:

Journal of Non-Crystalline Solids

Year:

2002

Language:

english

File:

PDF, 140 KB

english, 2002

41

Dislocation dynamics in doped NaCl single crystals determined by pulsed NMR between RT and 300°C

Alsem, W. H. M., de Hosson, J. Th. M., Muenter, R., Tamler, H., Kanert, O.

Journal:

Radiation Effects

Year:

1983

Language:

english

File:

PDF, 332 KB

english, 1983

42

NMR investigation of defect properties in single crystal SrTiO 3

Hackmann, Andreas, Kanert, Otmar

Journal:

Radiation Effects and Defects in Solids

Year:

1991

Language:

english

File:

PDF, 205 KB

english, 1991

43

Dislocation dynamics in Al–Mg–Zn alloys: A nuclear magnetic resonance and transmission electron microscopic study

De Hosson, J. Th. M., Kanert, O., Schlagowski, U., Boom, G.

Journal:

Journal of Materials Research

Year:

1988

Language:

english

File:

PDF, 3.40 MB

english, 1988

44

A Nuclear Magnetic Resonance and Transmission Electron Microscopic Studyof Moving Dislocations in Ternary Al-Base Alloys

De Hosson, J. Th. M., Kanert, O.

Journal:

MRS Proceedings

Year:

1988

Language:

english

File:

PDF, 356 KB

english, 1988

45

Nuclear magnetic resonance in tellurium single crystals: Electron paramagnetism and atomic self-diffusion mechanisms

H. Selbach, O. Kanert

Journal:

Solid State Communications

Year:

1978

Language:

english

File:

PDF, 427 KB

english, 1978

46

In-situnuclear magnetic resonance investigation of strain, temperature, and strain-rate variations of deformation-induced vacancy concentration in aluminum

K. Linga Murty, K. Detemple, O. Kanert, J. Th. M. Dehosson

Journal:

Metallurgical and Materials Transactions A

Year:

1998

Language:

english

File:

PDF, 255 KB

english, 1998

47

Nature of the linear frequency-dependent ac conductivity in glassy ionic conductors

U Strom, K.L Ngai, O Kanert

Journal:

Journal of Non-Crystalline Solids

Year:

1991

Language:

english

File:

PDF, 488 KB

english, 1991

48

Motion of oxygen in vanadium and niobium studied by nuclear magnetic resonance

Michel, B., Kanert, O., Günther, B.

Journal:

Acta Metallurgica et Materialia

Year:

1994

Language:

english

File:

PDF, 547 KB

english, 1994

49

Determination of Gradient-Elastic Constants in Cubic Solids

Hackeloer, H. J., Kanert, O.

Journal:

Zeitschrift für Naturforschung A

Year:

1972

Language:

english

File:

PDF, 4.55 MB

english, 1972

50

Charged-particle spectra from antiproton annihilation at rest in = 12–238 nuclei

HOFMANN, P, HARTMANN, F, DANIEL, H, VONEGIDY, T, KANERT, W, MARKIEL, W, PLENDL, H, MACHNER, H, RIEPE, G, PROTIC, D

Journal:

Nuclear Physics A

Year:

1990

File:

PDF, 648 KB

1990

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